Business area
To provide the best products and systems without settling for our current achievements,
we strive relentlessly.
Inspector
A next-generation inspection solution using non-destructive, non-contact methods.
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Next-Generation Inspection Equipment Utilizing Terahertz Waves
- Capable of precision inspection across various fields
- Faster process speeds compared to contact methods due to non-contact / non-destructive inspection and measurement
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Two measurement modes
- Transmission mode: analysis of molecular structure and optical properties
- Application: porosity of separation membranes, inspection for foreign particles in materials, etc.
- Reflection mode: analysis of internal material structure and interfaces
- Application: semiconductor molding gap, anode electrode thickness, PR coating thickness, polymer cure degree, etc.
- Optical System Design & Analysis: delivering inspection and measurement technologies that meet customer expectations through optimized optical design
- AI Algorithms: implementing algorithms tailored to customer needs to minimize errors
- Inspection Equipment Applications
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- Semiconductor – thickness measurement of semiconductor packaging and glass substrates
- Lithium-Ion Battery – measurement of separator porosity and electrode thickness
- Patents
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- Device and method for inspecting quality of battery separator using terahertz wave (10-2025013-1423)
- Epoxy molding compound thickness measurement method and measurement device (10-2025002-6977)
- Device and method for measuring thickness (10-2819649-0000)
- Research Collaboration
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- Acknowledgements
Kim, H. S., et al. (2026). A dual-band terahertz analysis approach for concurrent measurement of battery separator thickness and porosity. Journal of Energy Storage, 169.
- Acknowledgements